Analog Devices ADCMP604BKSZ-RL

Comparator Single R-R I/P 5.5V 6-Pin SC-70 T/R

Comparator, 1 Func, 5000uV Offset-Max, 3ns Response Time, PDSO6

Rail-to-Rail, Very Fast, 2.5 V to 5.5 V, Single-Supply LVDS Comparators | IC COMP TTL/CMOS 1CHAN SC70-6

IC COMPARATOR 1 GEN PUR SC70-6

Tape & Reel (TR) Complementary LVDS Rail-to-Rail 5muA NICKEL PALLADIUM GOLD comparator circuit 5muA @ 3V 3ns 2mm 100muV

Rail to rail sing chan TTL/CMOS Compara

The ADCMP604/ADCMP605 are very fast comparators fabricated on the Analog Devices, Inc. proprietary XFCB2 process. These comparators are exceptionally versatile and easy to use. Features include an input range from VEE - 0.5 V to VCCI + 0.2 V, low noise, LVDS-compatible output drivers, and TTL/CMOS latch inputs with adjustable hysteresis and/or shut-down inputs. The devices offer 1.5 ns propagation delays with 1 ps rms random jitter (RJ). Overdrive and slew rate dispersion are typically less than 50 ps. A flexible power supply scheme allows the devices to operate with a single 2.5 V positive supply and a -0.5 V to +2.7 V input signal range up to a 5.5 V positive supply with a -0.5 V to +5.7 V input signal range. Split input/output supplies, with no sequencing restrictions on the ADCMP605, support a wide input signal range with greatly reduced power consumption. The LVDS-compatible output stage is designed to drive any standard LVDS input. The comparator input stage offers robust protection against large input overdrive, and the outputs do not phase reverse when the valid input signal range is exceeded. High speed latch and programmable hysteresis features are also provided in a unique single-pin control option. The ADCMP604 is available in a 6-lead SC70 package, and the ADCMP605 is available in a 12-lead LFCSP. Applications High speed instrumentation Clock and data signal restoration Logic level shifting or translation Pulse spectroscopy High speed line receivers Threshold detection Peak and zero-crossing detectors High speed trigger circuitry Pulse-width modulators Current-/voltage-controlled oscillators Automatic test equipment (ATE)