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Manufacturer Lifecycle StatusACTIVE (Last Updated: 1 day ago)
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Texas InstrumentsSN74ABT18652PM
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描述
由其分销商提供的 Texas Instruments SN74ABTH182646APM 的描述。
Scan Test Devices With 18-Bit Transceivers And egisters 64-LQFP -40 to 85
7ns 2 2 4.5V 5.5V 64mA Scan Test Device With Transceivers And Registers ABT 32mA LQFP-64 1.45mm
ABT SERIES DUAL 9-BIT BOUNDARY SCAN REG TRANSCEIVER TRUE OUTPUT PQFP64
Scan Test Device -40C to 85C 64-Pin LQFP Tray
Bus XCVR Dual 18-CH 3-ST 64-Pin LQFP Tray
IC SCAN TEST DEVICE 18BIT 64LQFP
SN74ABTH182646A SCAN TEST DEVICE
制造商别名
Texas Instruments 在全球拥有多个品牌，分销商可将其用作替代名称。Texas Instruments 也可称为以下名称：
- TI
- TEXAS
- TEXAS INST
- TEXAS INSTR
- TEXAS INSTRUMENT
- TEXAS INSTRUMENTS INC
- TEXAS INS
- TEXAS INSTRU
- TEXAS INSTRUMEN
- TI/NS
- TEX
- Texas Instruments (TI)
- TEXASIN
- TEXAS INSTRUMENTS INCORPORATED
- TEXINS
- TEXAS INTRUMENTS
- TEAXS
- TEXASI
- TEXAS INSTRUM
- TI Texas Instruments
- TEXAS USD
- TEXAS INSRUMENTS
- TEXAS INSRUMENT
- TEXAS INSTUMENTS
- TI-ROHS
- Texas Instr.
- Texas Instruments Inc.
技术规格
Physical
Case/PackageLQFP
MountSurface Mount
Number of Pins64
Weight342.689036 mg
Technical
DirectionBidirectional
Logic FunctionAND, Transceiver
Max Operating Temperature85 °C
Max Supply Voltage5.5 V
Min Operating Temperature-40 °C
Min Supply Voltage4.5 V
Number of Bits18
Number of Channels18
Number of Elements2
Number of Outputs18
Operating Supply Voltage5 V
PackagingBulk
PolarityNon-Inverting
Propagation Delay15 ns
Quiescent Current20 mA
Turn-On Delay Time15 ns
Dimensions
Height1.6 mm
Length10 mm
Thickness1.4 mm
Width10 mm