Texas Instruments SN74BCT8374ADW

Scan Test Device With Octal D-Type Edge-Triggered Flip-Flops 24-SOIC 0 to 70
$ 9.18
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Texas Instruments

Datasheet26 pages11 years ago
Official datasheet0 pages0 years ago
Datasheet26 pages15 years ago
Technical Drawing2 pages15 years ago
Datasheet28 pages18 years ago

Newark

SHENGYU ELECTRONICS

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Sierra IC

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Supply Chain

Lifecycle StatusProduction (Last Updated: 1 week ago)
Manufacturer Lifecycle StatusACTIVE (Last Updated: 1 week ago)

Engineering Resources

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Descriptions

Descriptions of Texas Instruments SN74BCT8374ADW provided by its distributors.

Scan Test Device With Octal D-Type Edge-Triggered Flip-Flops 24-SOIC 0 to 70
Flip Flop D-Type Bus Interface Pos-Edge 3-ST 1-Element 24-Pin SOIC Tube
LOGIC, SCAN TEST DEVICE W/FF, 24SOIC; Flip-Flop Type:D; Propagation Delay:6.7ns; Frequency:70MHz; Output Current:64mA; Trigger Type:Positive Edge; Supply Voltage Range:4.5V to 5.5V; Logic Case Style:SOIC; No. of Pins:24; Operating Temperature Range:0°C to +70°C; SVHC:No SVHC (20-Jun-2011); Logic Function Number:748374; Logic IC Base Number:748374; Logic IC Family:BCT; Logic IC Function:Scan Test Device with Octal D-Type Edge Triggered Flip-Flop; Output Type:Non Inverted; Package / Case:SOIC; Supply Voltage Max:5.5V; Supply Voltage Min:4.5V; Termination Type:SMD

Manufacturer Aliases

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