IC, DRIVER, 20DIP; Famille Logique/ Numéro de base: -; Type de verrou: Type D; Type de sortie CI: Standard; Temps de propagation: 150ns; Courant, sortie: 150mA; Type de boîtier CI logique: DIP; Nombre de broches: 20Broche(s); T
The TPIC6B273 is a monolithic, high-voltage,medium-current, power logic octal D-type latch with DMOS-transistor outputs designed for use in systems that require relatively high load power. The device contains a built-in voltage clamp onthe outputs for inductive transient protection. Power driver applications include relays, sole-noids, and other medium-current or high-voltage loads. The TPIC6B273 contains eight positive-edge-triggered D-type flip-flops with a direct clear input. Each flip-flop features an open-drain powerDMOS-transistor output. When clear (CLR ) is high, information at the Dinputs meeting the setup time requirements is transferred to the DRAIN outputs on the positive-going edge of the clock (CLK) pulse. Clock triggering occurs at a particular voltage level andis not directly related to the transition time of the positive-going pulse. When the clock input (CLK)is at either the high or low level, the D input signal has no effect at the output. An asynchronous CLRis provided to turn all eight DMOS-transistor outputs off. When data is low for a given output,the DMOS-transistor output is off. When data is high, the DMOS-transistor output has sink-current capability. Outputs are low-side, open-drain DMOStransistors with output ratings of 50 V and 150-mA continuous sink-current capability. Each output provides a 500-mA typical current limit at TC = 25oC. The current limit decreases as the junction temperature increases for additional device protection. The TPIC6B273 is characterized for operation over the operating case temperature range of -40oC to 125oC. Copyright (C) 1997, Texas Instruments Incorporated Production DATA information is current as of publication date. Products conform to specifications per the terms of Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters.