Texas Instruments TLC277CP

Dual Precision Single Supply Operational Amplifier 8-PDIP 0 to 70

Op Amp Dual Low Offset Voltage Amplifier 16V 8-Pin PDIP Tube

IC, OP AMP, DUAL CMOS, PDIP8, 277; No. of Amplifiers: 2 Amplifier; Bandwidth: 1.7MHz; Slew Rate: 3.6V/µs; Supply Voltage Range: 3V to 16V; Amplifier Case Style: DIP; No. of Pins: 8Pins; Operating Temperature Min: 0°C; Operating Temperature Max: 70°C; Product Range: -; Automotive Qualification Standard: -; MSL: -; SVHC: No SVHC (27-Jun-2018); Amplifer Supply Voltage: 3V to 16V; Amplifier Type: CMOS; Base Number: 277; Gain Bandwidth: 1.3MHz; IC Generic Number: 277; Input Offset Voltage Max: 500µV; No. of Amplifiers: 2Amplifiers; Op Amp Type: Precision; Operating Temperature Range: 0°C to +70°C; Supply Voltage + Nom: 16V; Supply Voltage Max: 16V; Supply Voltage Min: 3V

The TLC272 and TLC277 precision dual operational amplifiers combine a wide range of input offset voltage grades with low offset voltage drift, high input impedance, low noise, and speeds approaching those of general-purpose BiFETdevices. These devices use Texas Instruments silicon-gate Linc Mos (TM) technology, which provides offset voltage stability far exceeding the stability available with conventional metal-gate processes. The extremely high input impedance, low bias currents, and high slew rates make these cost effective devices ideal for applications previously reserved for BiFET and NFET products. Four offset voltage grades are available (C-suffix and I-suffix types), ranging from the low-cost TLC272 (10 mV) to the high-precision TLC277 (500 uV). These advantages, in combination with good common-mode rejection and supply voltage rejection, make these devices a good choice for new state-of-the-art designs as well as for upgrading existing designs. Copyright (C) 2002, Texas Instruments Incorporated Production DATA information is current as of publication date. Products conform to specifications per the terms of Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters.