Texas Instruments TLC272BIP

Dual, 16-V, 2-MHz, 2-mV offset voltage, In to V- operational amplifier 8-PDIP -40 to 85
$ 1.085
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Texas Instruments

Official datasheet0 SeitenVor 0 Jahren
Datasheet50 SeitenVor 14 Jahren
Technical Drawing2 SeitenVor 16 Jahren
Datasheet47 SeitenVor 18 Jahren

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Lieferkette

Lifecycle StatusProduction (Last Updated: 6 days ago)
Manufacturer Lifecycle StatusACTIVE (Last Updated: 6 days ago)

Verwandte Teile

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Dual, 16-V, 2-MHz, In to V- operational amplifier 8-PDIP -40 to 85
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Beschreibungen

Beschreibungen von Texas Instruments TLC272BIP, die von den Distributoren bereitgestellt werden.

Dual, 16-V, 2-MHz, 2-mV offset voltage, In to V- operational amplifier 8-PDIP -40 to 85
Op Amp Dual Low Offset Voltage Amplifier 16V 8-Pin PDIP Tube
Operational Amplifier, 2 Func, 2000uV Offset-Max, CMOS, PDIP8
The TLC272 and TLC277 precision dual operational amplifiers combine a wide range of input offset voltage grades with low offset voltage drift, high input impedance, low noise, and speeds approaching those of general-purpose BiFETdevices. These devices use Texas Instruments silicon-gate Linc Mos (TM) technology, which provides offset voltage stability far exceeding the stability available with conventional metal-gate processes. The extremely high input impedance, low bias currents, and high slew rates make these cost effective devices ideal for applications previously reserved for BiFET and NFET products. Four offset voltage grades are available (C-suffix and I-suffix types), ranging from the low-cost TLC272 (10 mV) to the high-precision TLC277 (500 uV). These advantages, in combination with good common-mode rejection and supply voltage rejection, make these devices a good choice for new state-of-the-art designs as well as for upgrading existing designs. Copyright (C) 2002, Texas Instruments Incorporated Production DATA information is current as of publication date. Products conform to specifications per the terms of Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters.

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